Published on 05-26-2013 06:55 AM
In advanced process technologies, electrical and timing problems due to variability can become a big issue. Due to various processing effects, a circuit performance (both speed and power) is dependent on specific layout attributes and can vary a lot from instance to instance. The accumulated effects can be severe to the point that it may cause the circuit to fail.
In this blog I will demonstrate how iDRM is used very effectively to measure and analyze millions or even billions of layout instances and determine possible impact on performance. We will focus on two layout dependent