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Thread: New method in Scanning Probe Microscopy--higher stability and finer resolution

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    New method in Scanning Probe Microscopy--higher stability and finer resolution

    Finer resolution with greater stability is possible using unique low-power (aW), low-noise (20 dB S/N), microwave harmonics generated within a nanoscale tip-sample junction for feedback control in place of the DC tunneling current. Please see the attached poster to be presented at the Microscopy & Microanalysis-2018 meeting in Baltimore Monday August 6th as Post-deadline poster PDP-18. Applications include true sub-nm resolution in the carrier profiling of semiconductors. This method is especially appropriate for resistive samples where the spreading resistance flattens plots of the tunneling current vs. tip-sample distance with a scanning tunneling microscope.

    New method in Scanning Probe Microscopy--higher stability and finer resolution-poster-posting.jpg

    Apologies, here is a link to a higher resolution image:
    45x92-Poster-MM2018-HagmannPrintx2-V4.pdf - Google Drive

    0 Not allowed!
    Last edited by mhagmann; 08-03-2018 at 11:16 AM. Reason: added a link to a higher resolution image
     

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