A typical architecture for integrating multiple IP blocks using the P1687 standard, which has specific languages (ICL and PDL) to define structural elements.
Tight co-operation between NXP and Mentor Graphics has demonstrated the benefits of using IEEE P1687 on a real industrial design manufactured at the 65 nm technology node. We created PDL files for the test setup of embedded mixed signal blocks on the instrument level. We also created the ICL descriptions of the instruments and their connections, up to the top level of the design. These experiments used Tessent IJTAG to automatically retarget the PDL descriptions from instrument level to the top-level chip pins. Top-level test benches were created to validate the correctness of the mixed signal tests. Test vectors were created as well, to transfer the test patterns to a production test. The results clearly show that test setup length can be reduced by up to 56%.
Furthermore, we confirmed that implementing the IJTAG-based tests can be done with a high level of automation. This demonstrates that tests described by IP providers at the instrument level can be automatically retargeted to the top level of the chip with a minimum of user input. Read the details in this white paper by Mentor Graphics and NXP Semiconductors.
Experimental results showing the average number of cycles per test (y-axis) for conventional methods of test control integration for IP blocks, compared to several approaches--SIBs(a), SIBs()b, SIBs(c)--employing IJTAG.